SCR Testing: Understanding Test and Measurement Parameters
This article explores SCR (Silicon Controlled Rectifier) testing parameters, including maximum rise of ON-state current, peak gate current, and test setups.
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16-22 of 22 posts (Page 2 of 2)
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SPI vs I2C: Understanding Serial Communication Protocols
This article explains the differences between SPI and I2C serial communication protocols, highlighting their features, use cases, and key differences.
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Understanding Boundary Scan and the JTEG Standard (IEEE 1149.1)
Explore Boundary Scan, a method for testing electronic circuits, and the IEEE 1149.1 standard (JTAG). Learn how it simplifies testing compared to older methods.
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Understanding Grounding Systems: Single Point, Multi Point, and Hybrid
Explore the fundamentals of grounding, including single-point, multi-point, and hybrid systems, and their applications in electronics and test & measurement.
VME Bus vs. PXI Bus: Key Differences Explained
A comparison of VME and PXI buses, highlighting their differences in features, performance, and applications.
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Voltage Doubler vs. Voltage Tripler vs. Voltage Quadrupler
This article compares voltage doublers, voltage triplers, and voltage quadruplers, outlining the differences between these voltage multiplier circuits.
Zener Diode Failure Modes: Open vs. Shorted
This article explains how to identify open and shorted zener diodes using resistance and voltage tests with a multimeter.
